Imaging technique reveals strains and defects in vanadium oxide

Researchers led by Edwin Fohtung, an associate professor of materials science and engineering at Rensselaer Polytechnic Institute, have developed a new technique for revealing defects in nanostructured vanadium oxide, a widely used transition metal with many potential applications including electrochemical anodes, optical applications, and supercapacitors. In the research—which was published in an article in the Royal Chemical Society journal CrystEngComm, and also featured on the cover of the edition—the team detailed a lensless microscopy technique to capture individual defects embedded in vanadium oxide nanoflakes.

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