Standard reference cantilevers for atomic force microscopy spring constant calibration

Atomic force microscopy (AFM) is a popular technique for interrogating surfaces on the micro and nano scales. The most common use for AFM is imaging; however, there are a variety of more specialized AFM techniques that can be used to determine electrical, mechanical, and chemical properties of surfaces. To adequately control the application of forces to surfaces for these techniques (especially mechanical property measurements), accurate stiffness calibrations of test cantilevers should be used.

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